Lecturers: Dr. Szabolcs Csonka, Dr. Endre Tóvári, Dr. Sándor Bordács (Dep. of Physics), Dr. Ferenc Réti (Dep. of Atomic Physics), Dr. Péter Fürjes (EK MFA), Dr. Levente Tapasztó (EK MFA)

Requirements: 3/0/0/v/4

Language: English

Mark: based on oral exam

Consultation: based on private communication

Time and place: Wednesday 9:30, F3213

 

 

 

TOPICS 2021

1. Objects at nanoscale. Characteristic length scales in electronics.
2. Examples from bio-nanotechnology: virus, structure of cell wall, DNA origami, Phage display technique, electrodes from viruses, gecho tape
3. Nanotechnology in chemistry: nanochatalysis, artifical photosynthesis, photochatalic decomposition of hydrocarbon, batteries, supercapacitors.
4. Nanotechnology in solar cells (Schockley–Queisser limit, multijunction cells, carrier multiplication, dye cells).
5. Scanning tunneling microscopy. 
6. Scanning electron microscopy.  Parts of SEM, operational principle, resolution. Electron sources, optics, magnetic lenses, depth of field, detectors: SE, BSE, EDS, EBD.
7. Transmission electron microscopy. Parts of TEM, operational principle, resolution.  Different operational modes (BF, DF, diffraction). High resolution TEM. Electron holography.  Electron energy loss spectroscopy, Lorentz TEM.  Near field optical microscope, operational principle. Resolution (NSOM).
8.  Molecular vibrations; infrared and Raman active excitations; dielectric function, absorption and reflectivity for vibrational excitations; phonons in solids (longitudinal and transversal modes)
9. Instrumentation of optical spectroscopy; schematics of a grating spectrometer, a Fourier-transform infrared spectrometer and a Raman spectrometer
10. Optical excitations in hydrogen-like atoms; X-ray spectroscopy; Ti:sapphire lasers; spectroscopy on a single molecule
11. Optical response of metals (Drude model); interband excitations in semiconductors, insulators; excitons 
12. New directions of electronics (spintronics, quantumelectronics, molecular electronics, memristors)
13. Basics of silicon technology, Moore's law, planar and 3D tri-gate MOS transistors, lithography (optical,  e-beam, soft)
14. MEMS systems, bulk and surface micromechanics, thin film deposition techniques, etching techniques (wet, dry, Bosch), examples from micromechanics (console, gyroscope, channels). NEMS examples. Microfluidic systems, low  Reynold number and consequences.
15. Top-down and bottom-up approaches: Lithography (optical, e-beam, nano imprint), thin film deposition techniques, PVD, CVD, MBE. Band gap engineering. FIB. Artificial photosinthesis, self-assembled from amphiphilic molecules, semiconductor nanowires.
16. SIMS and SNMS methods.  Principles, surface sensitivity, accessible information, limitation in quantitative results.
17. XPS and AES methods.  Principles, surface sensitivity, accessible information, comparison.

 

LECTURE NOTES 2019

Lecture 0:   Richard P. Feynman: There’s plenty of room at the bottom (1959)

                       Later lecture (1984) Video

Lecture 1-3: Introduction to Nanotechnology

 

 

Lecturers: Dr. Szabolcs Csonka, Dr. Sándor Bordács (Dep. of Physics), Dr. Gábor Dobos (Dep. of Atomic Physics)

Requirements: 3/0/0/v/4

Language: English

Mark: based on oral exam

Consultation: based on private communication

Time and place: Wednesday 9:30, MS Teams Online platform: Nanotechnology and Material Science

 

 

Structure and rules of the online lectures:

• For each lecture there will be a video, which you should listen.  Then a short test will be available online, which should be filled till next week. Its role is to give feedback how deeply you understand the content. Next week we will have  a discussion section from the same topic along the questions of the test, where I expect an interactive discussion. Then new video will be available with the new topic.
• The videos and slides you will find in the files and videos menu of Teams and at the homepage.
• In order to protect the voice quality and avoid slow down please enter the meeting of the online course with microphone and camera switched off.
• The important part will be recorded on videos, other recording is forbidden.
• Please use the chat window, if you have questions, observe some problems. There is a separate channel to each Lecture, please comment there.

Exam

There will be an oral exam.
It starts with an entrance part: a short test from the questions contained in the tests during the lecture.
Then one of the Topics (see webpage of the course) should be explained in detail after a preparation period. Lecture notes can be used during the preparation.  Then short prompt questions come from all other topics, here lecture notes cannot  be used. 
During the exam it is obligatory to use your web camera. At the beginning you should show your student card. In the evaluation the understanding of the topics and the underlying physical mechanisms are the important.

 

TOPICS 2020

1. 
   Objects at nanoscale. Characteristic length scales in electronics.
2. 
   Examples from bio-nanotechnology: virus, structure of cell wall, DNA origami, Phage display technique, electrodes from viruses, gecho tape
3. 
   Nanotechnology in chemistry: nanochatalysis, artifical photosynthesis, photochatalic decomposition of hydrocarbon, batteries, supercapacitors.
4. 
   Nanotechnology in solar cells (Schockley–Queisser limit, multijunction cells, carrier multiplication, dye cells).
5. 
   Scanning tunneling microscopy. 
6. 
   Scanning electron microscopy.  Parts of SEM, operational principle, resolution. Electron sources, optics, magnetic lenses, depth of field, detectors: SE, BSE, EDS, EBD.
7. 
   Transmission electron microscopy. Parts of TEM, operational principle, resolution.  Different operational modes (BF, DF, diffraction). High resolution TEM. Electron holography.  Electron energy loss spectroscopy, Lorentz TEM.  Near field optical microscope, operational principle. Resolution (NSOM).
8. 
    Molecular vibrations; infrared and Raman active excitations; dielectric function, absorption and reflectivity for vibrational excitations; phonons in solids (longitudinal and transversal modes)
9. 
   Instrumentation of optical spectroscopy; schematics of a grating spectrometer, a Fourier-transform infrared spectrometer and a Raman spectrometer
10. 
    Optical excitations in hydrogen-like atoms; X-ray spectroscopy; Ti:sapphire lasers; spectroscopy on a single molecule
11. 
    Optical response of metals (Drude model); interband excitations in semiconductors, insulators; excitons 
12. 
    New directions of electronics (spintronics, quantumelectronics, molecular electronics, memristors)
13. 
    Basics of silicon technology, Moore's law, planar and 3D tri-gate MOS transistors, lithography (optical,  e-beam, soft)
14. 
    MEMS systems, bulk and surface micromechanics, thin film deposition techniques, etching techniques (wet, dry, Bosch), examples from micromechanics (console, gyroscope, channels). NEMS examples. Microfluidic systems, low  Reynold number and consequences.
15. 
    Top-down and bottom-up approaches: Lithography (optical, e-beam, nano imprint), thin film deposition techniques, PVD, CVD, MBE. Band gap engineering. FIB. Artificial photosinthesis, self-assembled from amphiphilic molecules, semiconductor nanowires.
16. 
    SIMS and SNMS methods.  Principles, surface sensitivity, accessible information, limitation in quantitative results.
17. 
    XPS and AES methods.  Principles, surface sensitivity, accessible information, comparison.

 

 

 

 

 

 

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Topics 2019

1. Objects at nanoscale. Characteristic length scales in electronics.
2. Examples from bio-nanotechnology: virus, structure of cell wall, DNA origami, Phage display technique, electrodes from viruses, gecho tape
3. Nanotechnology in chemistry: nanochatalysis, artifical photosynthesis, photochatalic decomposition of hydrocarbon, batteries, supercapacitors.
4. Nanotechnology in solar cells (Schockley–Queisser limit, multijunction cells, carrier multiplication, dye cells).
5. Scanning tunneling microscopy. 
6. Scanning electron microscopy.  Parts of SEM, operational principle, resolution. Electron sources, optics, magnetic lenses, depth of field, detectors: SE, BSE, EDS, EBD.
7. Transmission electron microscopy. Parts of TEM, operational principle, resolution.  Different operational modes (BF, DF, diffraction). High resolution TEM. Electron holography.  Electron energy loss spectroscopy, Lorentz TEM.  Near field optical microscope, operational principle. Resolution (NSOM).
8.  Molecular vibrations; infrared and Raman active excitations; dielectric function, absorption and reflectivity for vibrational excitations; phonons in solids (longitudinal and transversal modes)
9. Instrumentation of optical spectroscopy; schematics of a grating spectrometer, a Fourier-transform infrared spectrometer and a Raman spectrometer
10. Optical excitations in hydrogen-like atoms; X-ray spectroscopy; Ti:sapphire lasers; spectroscopy on a single molecule
11. Optical response of metals (Drude model); interband excitations in semiconductors, insulators; excitons 
12. New directions of electronics (spintronics, quantumelectronics, molecular electronics, memristors)
13. Basics of silicon technology, Moore's law, planar and 3D tri-gate MOS transistors, lithography (optical,  e-beam, soft)
14. MEMS systems, bulk and surface micromechanics, thin film deposition techniques, etching techniques (wet, dry, Bosch), examples from micromechanics (console, gyroscope, channels). NEMS examples. Microfluidic systems, low  Reynold number and consequences.
15. Top-down and bottom-up approaches: Lithography (optical, e-beam, nano imprint), thin film deposition techniques, PVD, CVD, MBE. Band gap engineering. FIB. Artificial photosinthesis, self-assembled from amphiphilic molecules, semiconductor nanowires.
16. SIMS and SNMS methods.  Principles, surface sensitivity, accessible information, limitation in quantitative results.
17. XPS and AES methods.  Principles, surface sensitivity, accessible information, comparison.

 

Lecture Notes 2019

Lecture 0:   Richard P. Feynman: There’s plenty of room at the bottom (1959)

                       Later lecture (1984) Video
Lecture 1-3: Introduction to Nanotechnology
Lecture 4: Electron microscopy
Lecture 5: 2D Materials
Lecture 6: Scanning Probe Techniques (L. Tapasztó)
Lecture 7: Top-down approach and bottom up-approach
Lecture 8: Semiconductor technology, MEMS (P. Fürjes)
Lecture 9: Modern surface analytic techniques (G. Dobos)
Lecture 10: Novel directions in electronics: Quantum electronics, Memristors, Spintronics
Lecture 11: Top down approach and bottom up approach
Lecture 12-13: Optical spectroscopy 1,2  (S. Bordács)

 

 

Topics 2018

1. Objects at nanoscale. Characteristic length scales in electronics
2. Examples from bio-nanotechnology: virus, structure of cell wall, DNA origami, Phage display technique, electrodes from viruses, gecho tape
3. Nanotechnology in chemistry: nanochatalysis, artifical photosynthesis, photochatalic decomposition of hydrocarbon, batteries, supercapacitors.
4. Nanotechnology in solar cells (Schockley–Queisser limit, multijunction cells, carrier multiplication, dye cells).
5. Scanning tunneling microscopy. Feedback loop, piezo crystal, constant current/height mode, isolation of mechanical noises, tunnel current, resolution, STS, ITS, manipulation of atoms.
6. Atomic force microscopy 1. Basics of mechanics, different operational modes, surface forces, instabilities of cantilever, force- displacement curve, limitation of resolution.
7. Atomic force microscopy 2. Operation modes: static/dynamic, contact/non-contact. Friction force microscopy, DFM's operational principle.  Force dependence of frequency shift, atomic resolution. Tapping mode principle.
8. Kelvin probe microscopy,  Magnetic force microscopy: feed backing challenges, magnetic force induced by stray field. Magnetic resonance force microscopy.
9. Scanning electron microscopy.  Parts of SEM, operational principle, resolution. Electron sources, optics, magnetic lenses, depth of field, detectors: SE, BSE, EDS, EBD.
10. Transmission electron microscopy. Parts of TEM, operational principle, resolution.  Different operational modes (BF, DF, diffraction). High resolution TEM. Electron holography.  Electron energy loss spectroscopy, Lorentz TEM.  Near field optical microscope, operational principle. Resolution (NSOM).
11.  Molecular vibrations; infrared and Raman active excitations; dielectric function, absorption and reflectivity for vibrational excitations; phonons in solids (longitudinal and transversal modes)
12. Instrumentation of optical spectroscopy; schematics of a grating spectrometer, a Fourier-transform infrared spectrometer and a Raman spectrometer
13. Optical excitations in hydrogen-like atoms; X-ray spectroscopy; Ti:sapphire lasers; spectroscopy on a single molecule
14. Optical response of metals (Drude model); interband excitations in semiconductors, insulators; excitons 
15. New directions of electronics (spintronics, quantumelectronics, molecular electronics, memristors)
16. Basics of silicon technology, Moore's law, planar and 3D tri-gate MOS transistors, lithography (optical,  e-beam, soft)
17. MEMS systems, bulk and surface micromechanics, thin film deposition techniques, etching techniques (wet, dry, Bosch), examples from micromechanics (console, gyroscope, channels). NEMS examples. Microfluidic systems, low  Reynold number and consequences.
18. SIMS and SNMS methods.  Principles, surface sensitivity, accessible information, limitation in quantitative results.
19. XPS and AES methods.  Principles, surface sensitivity, accessible information, comparison.

Lecutre Notes 2018

Lecture 0:   Richard P. Feynman: There’s plenty of room at the bottom (1959)

                       Later lecture (1984) Video

 

Literature

Nano part:

Douglas Natelson: Nanostructures and Nanotechnology (Library of Inst. of Physics)

Stuart Lindsay: Introduction to Nanoscience (Library of Inst. of Physics)

Springer Handbook of Nanotechnology

Rainer Waser (Ed.): Nanoelectronics and Information Technology

Optics part:

Atkins: Molecular quantum mechanics

Struve: Fundamentals of molecular spectroscopy

Tinkham: Group theory and quantum mechanics (Library of Inst. of Physics)

Dressel: Electrodynamics of solids (Library of Inst. of Physics)

Sólyom: Fundamentals of teh Physics of Solids I. Chapter 13.  (Library of Inst. of Physics)

Kamarás: Bevezetés a modern optikába V. 11. fejezet

Surfacescience part:

S. Hofmann: Auger- and X-Ray Photoelectron Spectroscopy in Materials Science, Springer, 2012

John C. Vickerman, Ian Gilmore, Surface Analysis: The Principal Techniques, Wiley, 2011

D. Briggs, J.T. Grant: Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy, IMPublications, 2003

J.C. Vickerman, D. Briggs: ToF-SIMS: Surface Analysis by Mass Spectrometry, IMPublications, 2001

D. Briggs, M.P. Seah: Practical Surface Analysis, Wiley, 1990

 

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Topics 2019